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Proceedings of the Workshop on Picture Data Description and Management, August 27-28, 1980, Asilomar, Calif

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索取号:TN27-53/E904/1980
作者:Workshop on Picture Data Description and Management (1980 : Asilomar、 Calif.)、IEEE Computer Society. Technical Committee on Machine Intelligence and Pattern Analysis.、
出版社:New York IEEE Los Alamitos, CA : The Society, c1980.

14th Symposium on Logic in Computer Science : proceedings : July 2-5, 1999, Trento, Italy

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索取号:TP301-53/E991/14
作者:Symposium on Logic in Computer Science (14th : 1999 : Trento、 Italy)、IEEE Computer Society. Technical Committee on Mathematical Foundations of Computing.、
出版社:Los Alamitos, Calif : IEEE Computer Society Press, c1999.

Mathematical modeling and optimization : an essay for the design of computer-basedmodeling tools

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索取号:O242.1/E992
作者:ḦУrlimann、 Tony.、
出版社:Dordrecht ; Boston : Kluwer Academic, c1999.

Power algebras over semirings : with applications in mathematics and computer science

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索取号:O153.3/E991
作者:Golan、 Jonathan S.、
出版社:Dordrecht ; Boston : Kluwer Academic Publishers, c1999.

Computer science logic : 13th international workshop, CSL '99 : 8th annual conference of the EACSL, Madrid, Spain, September 20-25, 1999 : proceedings

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索取号:TP302.2-532/E20011/1999
作者:Workshop on Computer Science Logic (13th : 1999 : Madrid、 Spain)、Flum、 Jörg.、Rodríguez Artalejo、 M. (Mario)、European Association for Computer Science Logic. Conference (8th : 1999 : Madrid、 Spain)、
出版社:Berlin ; New York : Springer, c1999.

Scale-space theories in computer vision : second international conference, Scale-Space'99, Corfu, Greece, September 26-27, 1999 : proceedings

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索取号:TP391.4-532/E20013
作者:Scale-Space'99 (1999 : Corfu、 Greece)、Nielsen、 Mads、
出版社:Berlin ; New York : Springer-Verlag, 1999.

Logic in computer science : modelling and reasoning about systems

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索取号:TP301/E991
作者:Huth、 Michael、 1962-、Ryan、 Mark、 1962-、
出版社:New York : Cambridge University Press, 1999.

Submillimeter wave : proceedings of the symposium

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索取号:TN018-53/E802
作者:Symposium on Submillimeter Waves、 New York、 1970.、Fox、 Jerome、 ed.、Schlam、 Mark Howard、 ed.、Polytechnic Institute of Brooklyn. Microwave Research Institute.、
出版社:Brooklyn, N.Y., Polytechnic Press; [distributors: Wiley Interscience, 1971

Digest : 1979 IEEE MTT-S International Microwave Symposium

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索取号:TN019.2-7/E801/1979
作者:IEEE MTT-S International Microwave Symposium (1979 : Orlando、 Fla.)、Tracy、 John E、Institute of Electrical and Electronics Engineers、IEEE Microwave Theory and Techniques Society、
出版社:New York : Institute of Electrical and Electronics Engineers, c1979

Rational fault analysis

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索取号:TN106/E802
作者:Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、
出版社:New York : M. Dekker, 1977.

Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope

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索取号:TN153-53/E804/1974
作者:Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、
出版社:Chicago Ill. : IIT Research Institute, 1973.

Semiconductor devices for power conditioning

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索取号:TN303-53/E901/1981
作者:Brown Boveri Symposium on Semiconductor Devices for Power Conditioning (1981 : Brown Boveri Research Center)、Sittig、 Roland.、Roggwiller、 P.、
出版社:New York : Plenum Press, 1982.

Microscopy of semiconducting materials, 1981 : proceedings of the Royal Microscopical Society Conference held in St. Catherine's College, Oxford, 6-10 April 1981

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索取号:TN304-53/E902/1981
作者:
出版社:Bristol : Institute of Physics, c1981.

Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985

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索取号:TN304-53/E901/1985
作者:International Symposium on Defect Recognition and Image Processing in III-V Compounds (1985 : Montpellier、 France)、Fillard、 J. P.、
出版社:Amsterdam ; New York : Elsevier, 1985.

Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A.

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索取号:TN304-53/E903/2
作者:
出版社:New York : North-Holland, 1983.

Insulating films on semiconductors : proceedings of the second international conference, INFOS 81, Erlangen, Fed. Rep. of Germany, April 27-29, 1981

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索取号:TN304.055-53/E901/1981
作者:INFOS 81 (1981 : Erlangen、 Germany)、Schulz、 M. (Max)、Pensl、 G. (Gerhard)、
出版社:Berlin ; New York : Springer-Verlag, 1981.
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